TY - GEN
T1 - Reliability Analysis of Phased-Mission K-out-of-n Systems with Cascading Effect
AU - Cai, Zhiqiang
AU - Zhou, Mi
AU - Zhang, Shuai
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/12
Y1 - 2020/12
N2 - In this paper, an effective method is provided for the reliability evaluation of phased-mission k-out-of-n systems consisting of identical binary non-repairable elements subject to cascading effect. The proposed method considers statistical dependencies of component states across phases as well as dynamics in system configuration and success criteria. The proposed method is based on the total probability law, conditional probabilities and an efficient recursive formula to compute the overall mission reliability with the consideration of cascading effect. The difficulty in analysis is to allow for cascading effect that can affect different subsets of system components, and which can occur s-dependently.
AB - In this paper, an effective method is provided for the reliability evaluation of phased-mission k-out-of-n systems consisting of identical binary non-repairable elements subject to cascading effect. The proposed method considers statistical dependencies of component states across phases as well as dynamics in system configuration and success criteria. The proposed method is based on the total probability law, conditional probabilities and an efficient recursive formula to compute the overall mission reliability with the consideration of cascading effect. The difficulty in analysis is to allow for cascading effect that can affect different subsets of system components, and which can occur s-dependently.
KW - cascading effect
KW - k-out-of-n system
KW - phased-mission system
KW - reliability analysis
UR - http://www.scopus.com/inward/record.url?scp=85099397630&partnerID=8YFLogxK
U2 - 10.1109/QRS-C51114.2020.00063
DO - 10.1109/QRS-C51114.2020.00063
M3 - 会议稿件
AN - SCOPUS:85099397630
T3 - Proceedings - Companion of the 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security, QRS-C 2020
SP - 324
EP - 327
BT - Proceedings - Companion of the 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security, QRS-C 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 20th IEEE International Conference on Software Quality, Reliability, and Security, QRS 2020
Y2 - 11 December 2020 through 14 December 2020
ER -