Realization of the direct method of measurement of the leakage current and the junction capacitance for CdZnTe detector

Yuan Dong Li; Guo Qiang Zeng; Liang Quan Ge; Cheng Jun Tan; Ya Dong Xu

Realization of the direct method of measurement of the leakage current and the junction capacitance for CdZnTe detector

Yuan Dong Li, Guo Qiang Zeng, Liang Quan Ge, Cheng Jun Tan, Ya Dong Xu

School of Materials Sience and Engineering

Chengdu University of Technology

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

In order to make up for the deficiency of the indirect testing methods of the leakage current and the junction capacitance of CdZnTe (CZT) detector, this article adopts direct testing methods of measurement to redesign testing solution. Through the test of CdZnTe detector, we get more accurate values of the leakage current and the junction capacitance and compare them with the values of indirect methods, thus providing more reliable reference for its application in the field of radiation detection.

Original language	English
Pages (from-to)	747-749 and 754
Journal	Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology
Volume	36
Issue number	7
State	Published - 20 Jul 2016

Keywords

CZT detector
Direct testing methods
The junction capacitance
The leakage current

Cite this

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title = "Realization of the direct method of measurement of the leakage current and the junction capacitance for CdZnTe detector",

abstract = "In order to make up for the deficiency of the indirect testing methods of the leakage current and the junction capacitance of CdZnTe (CZT) detector, this article adopts direct testing methods of measurement to redesign testing solution. Through the test of CdZnTe detector, we get more accurate values of the leakage current and the junction capacitance and compare them with the values of indirect methods, thus providing more reliable reference for its application in the field of radiation detection.",

keywords = "CZT detector, Direct testing methods, The junction capacitance, The leakage current",

author = "Li, {Yuan Dong} and Zeng, {Guo Qiang} and Ge, {Liang Quan} and Tan, {Cheng Jun} and Xu, {Ya Dong}",

year = "2016",

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journal = "Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology",

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T1 - Realization of the direct method of measurement of the leakage current and the junction capacitance for CdZnTe detector

AU - Li, Yuan Dong

AU - Zeng, Guo Qiang

AU - Ge, Liang Quan

AU - Tan, Cheng Jun

AU - Xu, Ya Dong

PY - 2016/7/20

Y1 - 2016/7/20

N2 - In order to make up for the deficiency of the indirect testing methods of the leakage current and the junction capacitance of CdZnTe (CZT) detector, this article adopts direct testing methods of measurement to redesign testing solution. Through the test of CdZnTe detector, we get more accurate values of the leakage current and the junction capacitance and compare them with the values of indirect methods, thus providing more reliable reference for its application in the field of radiation detection.

AB - In order to make up for the deficiency of the indirect testing methods of the leakage current and the junction capacitance of CdZnTe (CZT) detector, this article adopts direct testing methods of measurement to redesign testing solution. Through the test of CdZnTe detector, we get more accurate values of the leakage current and the junction capacitance and compare them with the values of indirect methods, thus providing more reliable reference for its application in the field of radiation detection.

KW - CZT detector

KW - Direct testing methods

KW - The junction capacitance

KW - The leakage current

UR - http://www.scopus.com/inward/record.url?scp=85015280397&partnerID=8YFLogxK

M3 - 文章

AN - SCOPUS:85015280397

SN - 0258-0934

VL - 36

SP - 747-749 and 754

JO - Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology

JF - Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology

IS - 7

ER -

Realization of the direct method of measurement of the leakage current and the junction capacitance for CdZnTe detector

Abstract

Keywords

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