Probing charged impurities in suspended graphene using raman spectroscopy

Zhen Hua Ni, Ting Yu, Zhi Qiang Luo, Ying Ying Wang, Lei Liu, Choun Pei Wong, Jianmin Miao, Wei Huang, Ze Xiang Shen

Research output: Contribution to journalArticlepeer-review

209 Scopus citations

Abstract

Charged impurity (CI) scattering is one of the dominant factors that affects the carrier mobility in graphene. In this paper, we use Raman spectroscopy to probe the charged impurities in suspended graphene. We find that the 2D band intensity is very sensitive to the CI concentration in graphene, while the G band intensity is not affected. The intensity ratio between the 2D and G bands, I 2D/I G, of suspended graphene is much stronger compared to that of nonsuspended graphene, due to the extremely low CI concentration in the former. This finding is consistent with the ultrahigh carrier mobility in suspended graphene observed in recent transport measurements. Our results also suggest that at low CI concentrations that are critical for device applications, the I 2D/I G ratio is a better criterion in selecting high quality single layer graphene samples than is the G band blue shift.

Original languageEnglish
Pages (from-to)569-574
Number of pages6
JournalACS Nano
Volume3
Issue number3
DOIs
StatePublished - 24 Mar 2009
Externally publishedYes

Keywords

  • Charged impurities
  • Mobility
  • Raman
  • Scattering rat
  • Suspended graphene

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