@inproceedings{aa9ea9de2ce14263bd54195dcc3290de,
title = "Preparation, microstructure characterization and dielectric properties of relaxor ferroelectric thick films",
abstract = "The phase structure and the microstructure of pyrochlor-free (1-x)PMN-xPT (x=0.2∼0.4) relaxor ferroelectric thick films prepared by an electrophoretic deposition on Pt substrate were investigate by XRD and SEM. The dielectric permittivity maximum εm (at 1 kHz) were in the range of 18000∼26500. Relaxor-like behavior was clearly demonstrated in PMN-PT thick-films. Deviation from Curie-Weiss behavior and temperature evolution of the local order parameter were found in the films. The degree of relaxation obtained from the modified Curie-Weiss law strongly suggests the relaxor behavior.",
keywords = "Dielectric properties, Electrophoretic deposition, PMN-PT films, Relaxor",
author = "Huiqing Fan and Jin Chen",
year = "2009",
doi = "10.1117/12.840379",
language = "英语",
isbn = "9780819478047",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "2nd International Conference on Smart Materials and Nanotechnology in Engineering",
note = "2nd International Conference on Smart Materials and Nanotechnology in Engineering ; Conference date: 08-07-2009 Through 11-07-2009",
}