On the crystallographic study of growth characterization of isolated void in the grain boundary

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Abstract

The growth characterization of an isolated spherical void in the grain boundary of anisotropic bicrystals was studied. The emphasis was placed on the role of the grain boundaries (perpendicular, tilt and parallel grain boundary) with respect to the external mechanical loading. The three-dimensional rate-dependent crystallographic model was applied in this paper. It is found that the resolved shear stress has a constant value in the mid-section of two grains. And there is high stress gradient and high stress concentration near the grain boundary, especially close to the void. The stress concentrations and growth of the void are greatly dependent on crystallographic orientations of grains and loading direction. The void grows more easily in the grain boundary perpendicular to the loading direction. In addition, the existence of void induces a complex activation of slip systems.

Original languageEnglish
Pages (from-to)140-146
Number of pages7
JournalComputational Materials Science
Volume40
Issue number1
DOIs
StatePublished - Jul 2007

Keywords

  • Bicrystal
  • Grain boundary
  • Resolved shear stress
  • Void growth

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