TY - GEN
T1 - Model Fitting Filter
AU - Wang, Xiaoxu
AU - Zhang, Jun
AU - Li, Chaofeng
AU - Pan, Quan
AU - Ding, Zhengtao
AU - Yin, Xin
N1 - Publisher Copyright:
© 2018 AACC.
PY - 2018/8/9
Y1 - 2018/8/9
N2 - In this paper, we present a new nonlinear filter based on variational inference, which we have named the model fitting filter (MFF). The core of MFF is to represent or fit the nonlinear measurement likelihood probability with a linear Gaussian probability (LGP) characterized by some parameters that need to be turned. Further, MFF is analytically established on LGP, which is a little similar to the simple linear system filter. Specifically, the nonlinear filtering performance is well improved by utilizing these turned parameters to correct the state estimation. At the same time, MFF does not require the square root decomposition of covariance matrix, so it avoids the inborn defect of numerical instability, which exists more or less in UKF or DDF. The superior performance of MFF is numerically tested by a target tracking problem with nonlinear models.
AB - In this paper, we present a new nonlinear filter based on variational inference, which we have named the model fitting filter (MFF). The core of MFF is to represent or fit the nonlinear measurement likelihood probability with a linear Gaussian probability (LGP) characterized by some parameters that need to be turned. Further, MFF is analytically established on LGP, which is a little similar to the simple linear system filter. Specifically, the nonlinear filtering performance is well improved by utilizing these turned parameters to correct the state estimation. At the same time, MFF does not require the square root decomposition of covariance matrix, so it avoids the inborn defect of numerical instability, which exists more or less in UKF or DDF. The superior performance of MFF is numerically tested by a target tracking problem with nonlinear models.
KW - model fitting filter
KW - Nonlinear estimation
KW - numerical instability
KW - variational inference
UR - http://www.scopus.com/inward/record.url?scp=85052561054&partnerID=8YFLogxK
U2 - 10.23919/ACC.2018.8431644
DO - 10.23919/ACC.2018.8431644
M3 - 会议稿件
AN - SCOPUS:85052561054
SN - 9781538654286
T3 - Proceedings of the American Control Conference
SP - 5479
EP - 5484
BT - 2018 Annual American Control Conference, ACC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Annual American Control Conference, ACC 2018
Y2 - 27 June 2018 through 29 June 2018
ER -