Leakage current conduction mechanism of Au-Pt-Ti/ HfO2-Al2O3/n-InAlAs metal-oxide-semiconductor capacitor under reverse-biased condition

He Guan, Shaoxi Wang

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Leakage current conduction mechanism of Au-Pt-Ti/ HfO2-Al2O3/n-InAlAs metal-oxide-semiconductor capacitor under reverse-biased condition'. Together they form a unique fingerprint.

Material Science