Investigation of the function for buffer layer in coated conductors

Y. Wang, L. Zhou, Y. F. Lu, C. S. Li, Z. M. Yu, L. H. Jin, J. S. Li

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied the detailed function of La2Zr2O7 (LZO) and CeO2 buffer layer in coated conductors. The results reveal that there is an obvious transformation trend of the orientation for NiO phase from (111) to (00l) in all samples with the increase of oxygen partial pressure in annealing atmosphere. Moreover, it indicates that LZO possesses an effective inhibiting function to the formation of NiO compared with CeO2. Therefore, it can be considered that LZO is often fit for being as barrier layer, while CeO2 is commonly to be as cap layer in multi-layer architecture of buffer layers in coated conductors.

Original languageEnglish
Pages (from-to)1149-1153
Number of pages5
JournalOptoelectronics and Advanced Materials, Rapid Communications
Volume4
Issue number8
StatePublished - 12 Aug 2010

Keywords

  • Buffer layer
  • Chemical solution deposition
  • Coated conductors

Fingerprint

Dive into the research topics of 'Investigation of the function for buffer layer in coated conductors'. Together they form a unique fingerprint.

Cite this