Introduction

Yongqiang Zhao; Chen Yi; Quan Pan; Yongmei Cheng; Seong G. Kong

doi:10.1007/978-3-662-49373-1_1

Introduction

Yongqiang Zhao, Chen Yi, Quan Pan, Yongmei Cheng, Seong G. Kong

School of Automation

Research output: Contribution to journal › Editorial

Abstract

In remote sensing, imaging instruments measure the energy of the light reflected or radiated from an object of interest in a number of different wavelength bands to observe physical as well as chemical characteristics of the object such as material composition and surface temperature distribution.

Original language	English
Pages (from-to)	1-11
Number of pages	11
Journal	Advances in Computer Vision and Pattern Recognition
DOIs	https://doi.org/10.1007/978-3-662-49373-1_1
State	Published - 2016

Keywords

High Spectral Resolution
Polarization Characteristic
Polarization Degree
Spectral Imaging
Surface Temperature Distribution

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10.1007/978-3-662-49373-1_1

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title = "Introduction",

abstract = "In remote sensing, imaging instruments measure the energy of the light reflected or radiated from an object of interest in a number of different wavelength bands to observe physical as well as chemical characteristics of the object such as material composition and surface temperature distribution.",

keywords = "High Spectral Resolution, Polarization Characteristic, Polarization Degree, Spectral Imaging, Surface Temperature Distribution",

author = "Yongqiang Zhao and Chen Yi and Quan Pan and Yongmei Cheng and Kong, {Seong G.}",

note = "Publisher Copyright: {\textcopyright} National Defense Industry Press, Beijing and Springer-Verlag Berlin Heidelberg 2016.",

year = "2016",

doi = "10.1007/978-3-662-49373-1_1",

language = "英语",

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journal = "Advances in Computer Vision and Pattern Recognition",

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AU - Zhao, Yongqiang

AU - Yi, Chen

AU - Pan, Quan

AU - Cheng, Yongmei

AU - Kong, Seong G.

N1 - Publisher Copyright: © National Defense Industry Press, Beijing and Springer-Verlag Berlin Heidelberg 2016.

PY - 2016

Y1 - 2016

N2 - In remote sensing, imaging instruments measure the energy of the light reflected or radiated from an object of interest in a number of different wavelength bands to observe physical as well as chemical characteristics of the object such as material composition and surface temperature distribution.

AB - In remote sensing, imaging instruments measure the energy of the light reflected or radiated from an object of interest in a number of different wavelength bands to observe physical as well as chemical characteristics of the object such as material composition and surface temperature distribution.

KW - High Spectral Resolution

KW - Polarization Characteristic

KW - Polarization Degree

KW - Spectral Imaging

KW - Surface Temperature Distribution

UR - http://www.scopus.com/inward/record.url?scp=85144851217&partnerID=8YFLogxK

U2 - 10.1007/978-3-662-49373-1_1

DO - 10.1007/978-3-662-49373-1_1

M3 - 社论

AN - SCOPUS:85144851217

SN - 2191-6586

SP - 1

EP - 11

JO - Advances in Computer Vision and Pattern Recognition

JF - Advances in Computer Vision and Pattern Recognition

ER -

Introduction

Abstract

Keywords

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