Induced reflection in Tamm plasmon systems

We present an induced reflection response analogue to electromagnetically induced transparency (EIT) in a novel Tamm plasmon system, consisting of a thin metal film and a Bragg grating with a defect layer. The results show that an induced narrow peak can be generated in the original broad reflection dip, which is attributed to the coupling and interference between the Tamm plasmon and defect modes in the grating structure. It is found that the EIT-like induced reflection is strongly dependent on the thickness of defect layer, grating period number between the metal and defect layers, thickness of Bragg grating layer, refractive index of defect layer, and thickness of metal film. Additionally, the induced reflection can be dynamically tuned by adjusting the angle of incident light. The numerical simulations agree extremely well with theoretical calculations. The coupling strength between the Tamm plasmon and defect modes is determined by the above parameters. These results will provide a new avenue for light field control and devices in multilayer photonic systems.