TY - JOUR
T1 - High-temperature dielectric and microwave absorption properties of Si3N4–SiC/SiO2 composite ceramics
AU - Li, Mian
AU - Yin, Xiaowei
AU - Zheng, Guopeng
AU - Chen, Meng
AU - Tao, Mingjie
AU - Cheng, Laifei
AU - Zhang, Litong
N1 - Publisher Copyright:
© 2014, Springer Science+Business Media New York.
PY - 2015/2
Y1 - 2015/2
N2 - A novel model with low–high–low permittivity hierarchical architecture was designed for high-temperature electromagnetic wave (EM) absorption. Si3N4–SiC/SiO2 composite ceramic was fabricated to verify this model. Dielectric properties of Si3N4–SiC/SiO2 in X-band from 25 to 600 °C were investigated. Due to the special designed structure, the effective permittivity of Si3N4–SiC/SiO2 increases slightly with rising temperature. When the temperature increases from 25 to 600 °C, average έ in X-band increases from 5.6 to 6.1, and ἕ increases from 3.0 to 3.8. Because of the weak temperature dependence of effective permittivity, Si3N4–SiC/SiO2 exhibits good coordination between room temperature EM absorption and high-temperature EM absorption. Minimum reflection coefficient (RC) of Si3N4–SiC/SiO2 at room temperature reaches −38.6 dB with the sample thickness of 3.2 mm. At 500 and 600 °C, minimum RC of Si3N4–SiC/SiO2 with certain sample thickness reaches −51.9 and −35.9 dB, respectively. Meanwhile, the effective bandwidth reaches 4.16 and 4.02 GHz, which indicates the promising prospect of Si3N4–SiC/SiO2 for high-temperature EM absorption.
AB - A novel model with low–high–low permittivity hierarchical architecture was designed for high-temperature electromagnetic wave (EM) absorption. Si3N4–SiC/SiO2 composite ceramic was fabricated to verify this model. Dielectric properties of Si3N4–SiC/SiO2 in X-band from 25 to 600 °C were investigated. Due to the special designed structure, the effective permittivity of Si3N4–SiC/SiO2 increases slightly with rising temperature. When the temperature increases from 25 to 600 °C, average έ in X-band increases from 5.6 to 6.1, and ἕ increases from 3.0 to 3.8. Because of the weak temperature dependence of effective permittivity, Si3N4–SiC/SiO2 exhibits good coordination between room temperature EM absorption and high-temperature EM absorption. Minimum reflection coefficient (RC) of Si3N4–SiC/SiO2 at room temperature reaches −38.6 dB with the sample thickness of 3.2 mm. At 500 and 600 °C, minimum RC of Si3N4–SiC/SiO2 with certain sample thickness reaches −51.9 and −35.9 dB, respectively. Meanwhile, the effective bandwidth reaches 4.16 and 4.02 GHz, which indicates the promising prospect of Si3N4–SiC/SiO2 for high-temperature EM absorption.
UR - http://www.scopus.com/inward/record.url?scp=84988304521&partnerID=8YFLogxK
U2 - 10.1007/s10853-014-8709-y
DO - 10.1007/s10853-014-8709-y
M3 - 文章
AN - SCOPUS:84988304521
SN - 0022-2461
VL - 50
SP - 1478
EP - 1487
JO - Journal of Materials Science
JF - Journal of Materials Science
IS - 3
ER -