Abstract
According to the architecture feature of the fault tolerant sensor system, a hierarchical combination reliability modeling method was proposed based on the dynamic fault tree analysis and the Markov process. Temporal operators were applied to represent the sequential logic, and the analytic formula for the failure probability of the top event was derived. The FDI (failure detection and isolation) behavior was modeled by the Markov process. The resultant model was compared to the PFCM (perfect fault coverage model). The impact of the parameters on the system reliability was evaluated. The simulation results demonstrate the modeling method is feasible, efficient and more accurate.
| Original language | English |
|---|---|
| Title of host publication | Sensors, Measurement and Intelligent Materials II |
| Pages | 532-541 |
| Number of pages | 10 |
| DOIs | |
| State | Published - 2014 |
| Event | 2013 2nd International Conference on Sensors, Measurement and lntelligent Materials, ICSMIM 2013 - Guangzhou, China Duration: 16 Nov 2013 → 17 Nov 2013 |
Publication series
| Name | Applied Mechanics and Materials |
|---|---|
| Volume | 475-476 |
| ISSN (Print) | 1660-9336 |
| ISSN (Electronic) | 1662-7482 |
Conference
| Conference | 2013 2nd International Conference on Sensors, Measurement and lntelligent Materials, ICSMIM 2013 |
|---|---|
| Country/Territory | China |
| City | Guangzhou |
| Period | 16/11/13 → 17/11/13 |
Keywords
- Dynamic fault tree
- Fault tolerant sensor system
- FDI parameters
- Hierarchical combination method
- Markov process