Grain growth in nanocrystalline Fe-Ag thin film

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Abstract

Isothermal grain growth kinetics of nanocrystalline Fe-Ag single-phase thin film, prepared by pulsed laser deposition, was investigated by X-ray diffraction (XRD). Using an empirical relation assuming that σb reduces with solute segregation, grain growth stops with saturated grain boundaries, corresponding to a metastable equilibrium system. It was found that higher Ag concentration gives smaller grain size at the metastable equilibrium, but favours phase separation upon annealing.

Original languageEnglish
Pages (from-to)1458-1462
Number of pages5
JournalMaterials Letters
Volume59
Issue number11
DOIs
StatePublished - May 2005
Externally publishedYes

Keywords

  • Grain growth
  • Kinetics
  • Nanocrystalline materials
  • X-ray diffraction (XRD)

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