Abstract
The effect of equal channel angular pressing (ECAP) through the route Bc and aging treatment on the grain structure and properties of the Cu-1Cr-0.2Si alloy was investigated. Microstructure was detected by scanning electron microscopy (SEM), x-ray diffraction (XRD), and electron backscatter diffraction (EBSD) and the mechanical properties and electrical conductivity were tested. Results shown that after ECAP, accompanying the grains refined to nano-and submicron-structure, the Cr particles were gradually spread along the grain boundaries (GBs), aging treatment promoted Cr particles dispersed in the matrix. ECAP greatly increased the ultimate tensile strength (UTS) while having a small effect on the conductivity, and aging treatment increased electrical conductivity. The stable 111<110> texture after ECAP and the lower dislocation density after aging treatment maybe the main reasons for the high conductivity of the material.
Original language | English |
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Article number | 1603 |
Journal | Materials |
Volume | 13 |
Issue number | 7 |
DOIs | |
State | Published - 1 Apr 2020 |
Externally published | Yes |
Keywords
- Cu-1Cr-0.2Si alloy
- Electrical conductivity
- Electron back-scattered diffraction (EBSD)
- Equal channel angular pressing (ECAP)
- Mechanical properties
- Texture