Enforced c-axis growth of ZnO epitaxial chemical vapor deposition films on a-plane sapphire

Yong Xie, Manfred Madel, Thilo Zoberbier, Anton Reiser, Wanqi Jie, Benjamin Neuschl, Johannes Biskupek, Ute Kaiser, Martin Feneberg, Klaus Thonke

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

To enforce perfect c-axis orientation of ZnO epitaxial films grown on a-plane sapphire, we first grew perfectly perpendicularly aligned (i.e., c axis oriented) ZnO nanopillars on such sapphire substrates, and then over-grew these by a closed epitaxial film using a modified chemical vapor deposition process at atmospheric pressure. X-ray diffraction and low temperature photoluminescence measurements confirm the desired epitaxial relationship and very high crystalline quality. This growth scheme is an efficient method to suppress dislocations and polycrystalline growth of ZnO and could work equally well for other heteroepitaxial epilayer/substrate systems.

Original languageEnglish
Article number182101
JournalApplied Physics Letters
Volume100
Issue number18
DOIs
StatePublished - 30 Apr 2012

Fingerprint

Dive into the research topics of 'Enforced c-axis growth of ZnO epitaxial chemical vapor deposition films on a-plane sapphire'. Together they form a unique fingerprint.

Cite this