Effects of annealing on the properties of CdZnTe epitaxial thick films deposited on p-GaAs using close-spaced sublimation

Yang Li, Kun Cao, Gangqiang Zha, Wenyu Zhang, Yiwei Li, Xin Wan, Wanqi Jie

Research output: Contribution to journalReview articlepeer-review

5 Scopus citations

Abstract

CdZnTe epitaxial thick films were deposited on p-type GaAs (001) substrates using close-spaced sublimation. In order to reduce defects in the CdZnTe/p-GaAs films and improve the carrier transport properties, isothermal annealing in a Te2 atmosphere was carried out. After annealing, the resistivity of the CdZnTe/p-GaAs samples increased and the leakage current decreased. In addition, the electron mobility and lifetime product μτe, measured by fitting 241Am@5.49 MeV α particles energy spectra with the Hecht equation using full peak channels under different voltages, were improved. Finally, a 241Am@59.5 keV γ ray energy spectrum of an annealed CdZnTe/p-GaAs sample was acquired. According to the etch pit density and photoluminescence spectrum, it was suggested that isothermal annealing reduced the dislocation density in the as-deposited CdZnTe films and therefore improved the performance of the annealed detectors.

Keywords

  • Annealing
  • Carrier transport properties
  • CdZnTe/p-GaAs films
  • Closed-spaced sublimation (CSS)
  • Defects
  • Radiation detectors

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