Diffusion behavior at void tip and its contributions to void shrinkage during solid-state bonding

C. Zhang, M. Q. Li, H. Li

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Fingerprint

Dive into the research topics of 'Diffusion behavior at void tip and its contributions to void shrinkage during solid-state bonding'. Together they form a unique fingerprint.

Engineering