Dielectric properties of ferroelectrics/ferrite cofired multilayer materials

Feng Gao, Xiang Chun Liu, Wei Min Wang, Hui Jun Zhang, Chang Sheng Tian

Research output: Contribution to journalArticlepeer-review

Abstract

The dielectric properties of ferroelectrics/ferrite cofired multilayer materials were investigated by equivalent circuit analysis. The results showed that the dielectric constant decreased with increasing frequency. It was observed that the loss peak appeared in the dissipation factor vs frequency curve. The equivalent circuit analysis revealed that the cofired ferroelectrics/ferrite multilayer composite was not simply series connection by the equivalent circuit of ferroelectrics and ferrite. The interface layer had effect on the dielectric properties of the composite. The thickness of the interface layer was similar to the diffusion distance, which had great influence on the dielectric properties at low frequency.

Original languageEnglish
Pages (from-to)3-7
Number of pages5
JournalCailiao Gongcheng/Journal of Materials Engineering
Issue number12
StatePublished - Dec 2005

Keywords

  • Cofired materials
  • Dielectric property
  • Ferrite
  • Ferroelectrics

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