Determination of IRFPA bad pixels with offset criterion

Bad pixels in infrared focal plane array (IRFPA) degrade quality of infrared images and performance of infrared system. In the final tests before IRFPA leaves factory, bad pixels are determined by three criterions: responsivity criterion, noise criterion and offset criterion. Research was focused on offset criterion. Principle of offset criterion was described and disadvantage of this criterion was discussed through analysis of test results. Then an improved offset criterion was brought forward. Compared with normal offset criterion using fixed offset value, the new concentric circle offset criterion decreased the error of taking bad pixel as qualified pixel. According to the principle of offset criterion, two new methods of determining bad pixels were given out. These two new approaches were based on output waveforms and gray maps of IRFPA. Their correct rates reach 90% and 82% respectively. They provide two visual, fast and convenient ways for determination of bad pixels in IRFPA.