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Dive into the research topics of 'Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber'. Together they form a unique fingerprint.- Sort by
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Hao Shen, Zhen Wang, Chun Wang, Pengfei Zou, Zhaoyang Hou, Chunlong Xu, Hongjing Wu
Research output: Contribution to journal › Article › peer-review