Decision diagrams method for k-out-of-n: G systems

Shu Min Li, Shu Bin Si, Shuai Zhang, Hong Yan Dui

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Binary k-out-of-n system is a commonly used reliability model in engineering practice. Many researches have extended the concept of k-out-of-n system to multi-state k-out-of-n systems. This paper proposes a binary decision diagram (BDD) based approach for binary k-out-of-n system: G system and a multi-state multi-valued decision diagram (MMDD) based approach for multi-state k-out-of-n: G system. BDD and MMDD have been extensively used for representing and manipulating logic functions in many areas, including reliability modeling and analysis. In this paper, patterns of BDD/MMDD for binary/multi-state k-out-of-n: G system are summarized and proved, and a two-step algorithmic process is proposed for modeling BDD/MMDD, a case is implemented to demonstrate the performance of the presented method.

Original languageEnglish
Title of host publicationQR2MSE 2013 - Proceedings of 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering
Pages263-267
Number of pages5
DOIs
StatePublished - 2013
Event2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2013 - Sichuan, China
Duration: 15 Jul 201318 Jul 2013

Publication series

NameQR2MSE 2013 - Proceedings of 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering

Conference

Conference2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2013
Country/TerritoryChina
CitySichuan
Period15/07/1318/07/13

Keywords

  • binary decision diagrams
  • G systems
  • k-out-of-n
  • multi-state multi-valued decision diagram

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