Data Association Based Fast Fault Detection for Low-Cost Micro/Nano-Satellite

Rongli Chen, Xiaodong Wang, Yangming Guo, Weihua Qin, Ximing Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Under most circumstances, it is very important to achieve fast and real-Time low-cost micro/nano-satellite fault detection. Regarding of faults as dynamic modes which observe through the multi-sensors, with probabilistic data association based on multi-sensor, we obtain the fault detection results according to the association probability and the threshold values. Joint Probabilistic Data Association (JPDA) algorithm is one of the effective ways for multi-sensor and multi-Target tracking. We improve the JPDA algorithm as follows: At first, we propose an approximation method for constructing the confirmation matrix by removing the small probability events using the right threshold, and then, we present the mathematical division of the confirmation matrix according to the intersection area of the association gate of fault targets to be tracked; Finally, we compute the association probability of fault targets through attenuating the value of the public measurement. The simulation results show preliminarily that our improved JPDA algorithm saves the computational time greatly, and meet the requirements of fast and real-Time fault detection effectively.

Original languageEnglish
Title of host publicationProceedings of 2020 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020
EditorsYong Qin, Ming J. Zuo, Xiaojian Yi, Limin Jia, Dejan Gjorgjevikj
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781728170503
DOIs
StatePublished - 5 Aug 2020
Event4th International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020 - Virtual, Beijing, China
Duration: 5 Aug 20207 Aug 2020

Publication series

NameProceedings of 2020 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020

Conference

Conference4th International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020
Country/TerritoryChina
CityVirtual, Beijing
Period5/08/207/08/20

Keywords

  • association probability
  • confirmation matrix
  • data association
  • fault detection

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