Counterfactual-augmented few-shot contrastive learning for machinery intelligent fault diagnosis with limited samples

Yunpeng Liu, Hongkai Jiang, Renhe Yao, Tao Zeng

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

Capturing sufficient and balanced data for intelligent fault diagnosis is significantly consumptive in practice. It is tricky and demand-oriented to identify faults accurately and reliably with limited samples. For this issue, contrastive learning is a promising attempt by learning discriminative representations (DRs). It is a research gap for contrast learning to apply in limited and imbalanced samples due to negative sample pairs, contrastive loss, and mechanistic interpretations. In this study, counterfactual-augmented few-shot contrastive learning (CAFCL) is proposed for intelligent fault diagnosis with limited samples. Firstly, a feature weight network is designed to exploit optimal features (OFs) with sparsity. Moreover, OFs are reliably unique with the assistance of weight updaters and feature sparsifiers. Next, counterfactual augmentation with OFs is defined for negative samples, whose plausibility is discussed in terms of causation. Thirdly, few-shot contrastive learning (FCL) is customized for intelligent fault diagnosis with limited samples, which reconciles global associations and local diffusions. Furthermore, model decisions are indicated by FCL via DRs, which are deemed to coincide with the fault mechanism of mechanical components. The feasibility and effectiveness of CAFCL are verified by various experiments on fault diagnosis. Results show that CAFCL is superior in few-shot intelligent fault diagnosis with promising engineering applications.

Original languageEnglish
Article number111507
JournalMechanical Systems and Signal Processing
Volume216
DOIs
StatePublished - 1 Jul 2024

Keywords

  • Counterfactual augmentation
  • Discriminative representations
  • Few-shot contrastive learning
  • Intelligent fault diagnosis
  • Limited samples
  • Optimal features

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