TY - JOUR
T1 - An organic field effect transistor memory adopting octadecyltrichlorosilane self-assembled monolayer
AU - Zhang, Peng
AU - Guo, Yun
AU - Cao, Keyang
AU - Yi, Mingdong
AU - Huang, Liya
AU - Shi, Wei
AU - Zhu, Jintao
AU - Huang, Wei
N1 - Publisher Copyright:
© 2020 IOP Publishing Ltd.
PY - 2021/3/4
Y1 - 2021/3/4
N2 - An organic nonvolatile memory is proposed based on octadecyltrichlorosilane self-assembled monolayer (ODTS SAM) and copper hexadecafluorophthalocyanine (F16CuPc) heterostructure, where F16CuPc acts as the active layer of the organic thin film transistor memory device, and ODTS SAM functions as the charge trapping layer. By adopting N-type active layer, sufficient electrons ensure the erasing process that is independent of the light illumination, indicating a fully electrically driving memory device, where large memory window is obtained. AFM images demonstrates that the monolayer provides the trapping sites. The trapping mechanism is analyzed based on the electric dipoles theory, the dipoles orientation in the monolayer is critical for providing trapping sites, which fixes the mobile carriers at the ODTS SAM/F16CuPc interface. The writing-reading-erasing-reading (WRER) tests and the retention time are shown, and they can be further optimized by involving a thin polystyrene tunneling layer between active layer and charge trapping layer, with an retention time of approximately 125 d, and a sufficient WRER reading current ratio of more than 103 for practical fully electrically driving binary nonvolatile memory device applications.
AB - An organic nonvolatile memory is proposed based on octadecyltrichlorosilane self-assembled monolayer (ODTS SAM) and copper hexadecafluorophthalocyanine (F16CuPc) heterostructure, where F16CuPc acts as the active layer of the organic thin film transistor memory device, and ODTS SAM functions as the charge trapping layer. By adopting N-type active layer, sufficient electrons ensure the erasing process that is independent of the light illumination, indicating a fully electrically driving memory device, where large memory window is obtained. AFM images demonstrates that the monolayer provides the trapping sites. The trapping mechanism is analyzed based on the electric dipoles theory, the dipoles orientation in the monolayer is critical for providing trapping sites, which fixes the mobile carriers at the ODTS SAM/F16CuPc interface. The writing-reading-erasing-reading (WRER) tests and the retention time are shown, and they can be further optimized by involving a thin polystyrene tunneling layer between active layer and charge trapping layer, with an retention time of approximately 125 d, and a sufficient WRER reading current ratio of more than 103 for practical fully electrically driving binary nonvolatile memory device applications.
UR - http://www.scopus.com/inward/record.url?scp=85098289465&partnerID=8YFLogxK
U2 - 10.1088/1361-6463/abcb35
DO - 10.1088/1361-6463/abcb35
M3 - 文章
AN - SCOPUS:85098289465
SN - 0022-3727
VL - 54
JO - Journal of Physics D: Applied Physics
JF - Journal of Physics D: Applied Physics
IS - 9
M1 - 095106
ER -