Abstract
This paper proposes an accelerated ray tracing method utilizing the Embree3 ray tracing library for targets with non-uniform thickness materials. In contrast to the traditional surface-based ray tracing, the proposed approach performs ray tracing within the materials, since surface tracing is ineffective for materials with non-uniform thickness. To ensure efficiency and handle the overlapping grids between different materials, the Embree3 ray tracing library is introduced to ray intersection. Numerical results confirm that the proposed method surpasses existing methods in terms of efficiency and applicability while maintaining accuracy.
Original language | English |
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Pages (from-to) | 527-532 |
Number of pages | 6 |
Journal | Applied Computational Electromagnetics Society Journal |
Volume | 39 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2024 |
Keywords
- Accelerated ray tracing method
- electromagnetic scattering
- thick materials