A theoretical analysis to current exponent variation regularity and electromigration-induced failure

Yuexing Wang, Yao Yao

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Fingerprint

Dive into the research topics of 'A theoretical analysis to current exponent variation regularity and electromigration-induced failure'. Together they form a unique fingerprint.

Chemical Engineering

Material Science

Engineering