A Nonlinear Mixed Finite Element Method for the Analysis of Flexoelectric Semiconductors

Qiufeng Yang, Xudong Li, Zhaowei Liu, Feng Jin, Yilin Qu

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, we develop a nonlinear mixed finite element method for flexoelectric semiconductors and analyze the mechanically tuned redistributions of free carriers and electric currents through flexoelectric polarization in typical structures. We first present a macroscopic theory for flexoelectric semiconductors by combining flexoelectricity and nonlinear drift-diffusion theory. To use C0 continuous elements, we derive an incremental constrained weak form by introducing Langrage multipliers, in which the kinematic constraints between the displacement and its gradient are guaranteed. Based on the weak form, we established a mixed C0 continuous nine-node quadrilateral finite element as well as an iterative process for solving nonlinear boundary-value problems. The accuracy and convergence of the proposed element are validated by comparing linear finite element method results against analytical solutions for the bending of a beam. Finally, the nonlinear element method is applied to more complex problems, such as a circular ring, a plate with a hole, and an isosceles trapezoid. Results indicate that mechanical loads and doping levels have distinct influences on electric properties.

Original languageEnglish
Article number071008
JournalJournal of Applied Mechanics, Transactions ASME
Volume91
Issue number7
DOIs
StatePublished - 1 Jul 2024

Keywords

  • computational mechanics
  • electromechanical coupling
  • flexoelectric semiconductors
  • micromechanics
  • nonlinear drift-diffusion theory
  • nonlinear mixed finite methods
  • strain-gradient effect
  • stress analysis
  • structures

Fingerprint

Dive into the research topics of 'A Nonlinear Mixed Finite Element Method for the Analysis of Flexoelectric Semiconductors'. Together they form a unique fingerprint.

Cite this