A multivariate process capability index with a spatial coefficient

Shaoxi Wang, Mingxin Wang, Xiaoya Fan, Shengbing Zhang, Ru Han

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

After analyzing the multivariate Cpm method (Chan et al. 1991), this paper presents a spatial multivariate process capability index (PCI) method, which can solve a multivariate off-centered case and may provide references for assuring and improving process quality level while achieving an overall evaluation of process quality. Examples for calculating multivariate PCI are given and the experimental results show that the systematic method presented is effective and actual.

Original languageEnglish
Article number026001
JournalJournal of Semiconductors
Volume34
Issue number2
DOIs
StatePublished - Feb 2013

Keywords

  • multivariate
  • off-center
  • process
  • process capability index

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