XAFS and XRD studies of the Cd1-xZnxTe crystal fine structure

Tao Feng, Gangqiang Zha, Jian Yang, Jiong Li, Zheng Jiang, Lingyan Xu, Tao Wang, Wanqi Jie

科研成果: 期刊稿件会议文章同行评审

3 引用 (Scopus)

摘要

Cd1-xZnxTe crystal is a new kind of room temperature semiconductor radiation detector material developed in recent years. Cd 1-xZnxTe is zinc-blende structure, which is similar to CdTe, but the fine structure of Cd1-xZnxTe ternary compound semiconductor is different from CdTe and ZnTe binary compound semiconductors. In this contribution, the fine structure of Cd 1-xZnxTe has been studied by the synchrotron radiation X-ray absorption fine structure (XAFS) technology and X-ray diffraction (XRD) technology. The K-edges XAFS spectra of cadmium, zinc and tellurium in Cd 1-xZnxTe have been obtained, and the differences between the structures of binary and ternary compound crystals have also been analyzed. The Fourier transform of the k2-weighted absorption spectra prove that Zn atoms occupy the position of the Cd atoms. The bond lengths of Cd 1-xZnxTe have also been obtained by extended X-ray absorption fine structure (EXAFS), and the results imply that the local atomic structure of Cd1-xZnxTe is distorted. The doping of Zn in the structure contributes to the distortion, which should be responsible for the different properties in Cd1-xZnxTe. Normalized X-ray absorption near-edge structure (XANES) spectra on Cd K-edge, Zn K-edge and Te K-edge in CdTe, Cd0.96Zn0.04Te, Cd0.9Zn 0.1Te and ZnTe are also shown.

源语言英语
文章编号012087
期刊Journal of Physics: Conference Series
430
1
DOI
出版状态已出版 - 2013
活动15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012 - Beijing, 中国
期限: 22 7月 201228 7月 2012

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