X-ray photoelectron spectroscopy study of (LaxBi1-x)2 Ti2O7 thin film

Yin Zhang; Hong Wang; Xue Na Yang; Wei Feng Yao; Shu Xia Shang; Wei Min Liu

X-ray photoelectron spectroscopy study of (La_xBi_1-x)₂ Ti₂O₇ thin film

Yin Zhang, Hong Wang, Xue Na Yang, Wei Feng Yao, Shu Xia Shang, Wei Min Liu

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

(La_xBi_1-x)₂ Ti₂O₇ (BLT) and Bi₂Ti₂O₇(BTO)films were prepared on Si(100) substrates by chemical solution deposition (CSD). The result of X-ray diffraction (XRD)patterns show the films with good orientation. X-ray photoelectron Spectroscopy (XPS) measurements were executed to compare the nature of defects in those films. It was found that phase stability of thin film is affected by oxygen vacancies after substituting Bi atoms with some La atoms the quality of BLT thin films is improved.

源语言	英语
页（从-至）	50-52
页数	3
期刊	Yadian Yu Shengguang/Piezoelectrics and Acoustooptics
卷	27
期	1
出版状态	已出版 - 2月 2005
已对外发布	是

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title = "X-ray photoelectron spectroscopy study of (LaxBi1-x)2 Ti2O7 thin film",

abstract = "(LaxBi1-x)2 Ti2O7 (BLT) and Bi2Ti2O7(BTO)films were prepared on Si(100) substrates by chemical solution deposition (CSD). The result of X-ray diffraction (XRD)patterns show the films with good orientation. X-ray photoelectron Spectroscopy (XPS) measurements were executed to compare the nature of defects in those films. It was found that phase stability of thin film is affected by oxygen vacancies after substituting Bi atoms with some La atoms the quality of BLT thin films is improved.",

keywords = "BiTiOthin film, CSD, XPS",

author = "Yin Zhang and Hong Wang and Yang, {Xue Na} and Yao, {Wei Feng} and Shang, {Shu Xia} and Liu, {Wei Min}",

year = "2005",

month = feb,

language = "英语",

volume = "27",

pages = "50--52",

journal = "Yadian Yu Shengguang/Piezoelectrics and Acoustooptics",

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T1 - X-ray photoelectron spectroscopy study of (LaxBi1-x)2 Ti2O7 thin film

AU - Zhang, Yin

AU - Wang, Hong

AU - Yang, Xue Na

AU - Yao, Wei Feng

AU - Shang, Shu Xia

AU - Liu, Wei Min

PY - 2005/2

Y1 - 2005/2

N2 - (LaxBi1-x)2 Ti2O7 (BLT) and Bi2Ti2O7(BTO)films were prepared on Si(100) substrates by chemical solution deposition (CSD). The result of X-ray diffraction (XRD)patterns show the films with good orientation. X-ray photoelectron Spectroscopy (XPS) measurements were executed to compare the nature of defects in those films. It was found that phase stability of thin film is affected by oxygen vacancies after substituting Bi atoms with some La atoms the quality of BLT thin films is improved.

AB - (LaxBi1-x)2 Ti2O7 (BLT) and Bi2Ti2O7(BTO)films were prepared on Si(100) substrates by chemical solution deposition (CSD). The result of X-ray diffraction (XRD)patterns show the films with good orientation. X-ray photoelectron Spectroscopy (XPS) measurements were executed to compare the nature of defects in those films. It was found that phase stability of thin film is affected by oxygen vacancies after substituting Bi atoms with some La atoms the quality of BLT thin films is improved.

KW - BiTiOthin film

KW - CSD

KW - XPS

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M3 - 文章

AN - SCOPUS:15044338868

SN - 1004-2474

VL - 27

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JO - Yadian Yu Shengguang/Piezoelectrics and Acoustooptics

JF - Yadian Yu Shengguang/Piezoelectrics and Acoustooptics

IS - 1

ER -

X-ray photoelectron spectroscopy study of (LaxBi1-x)2 Ti2O7 thin film

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X-ray photoelectron spectroscopy study of (La_xBi_1-x)₂ Ti₂O₇ thin film