Thermal cycling aging effects on the tensile property of lead-free solder Sn-3Ag-0.5Cu

Bingjie Chen, Kaimin Wang, Yao Yao

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Structural reliability issues attract more and more attentions with the rapid development of electronic packaging industry. Sn-Ag-Cu alloys have long been used as solder materials for the interconnections of microelectronic devices because of low melting temperature and good wettability. Many tensile tests were performed on Sn-3Ag-0.5Cu solder alloys at various strain rates and over a wide temperature range [1]. And thermal cycling aging studies on a lead-free Sn-Ag-Cu solder joint were investigated [2]. In this study, a series of tensile tests of Sn-3Ag-0.5Cu were investigated at different number of cycles and different temperatures. The possible mechanism of tensile strength, ductility improvement were discussed. The samples were placed in liquid nitrogen environment at 77 K for 10 minutes and then 293K(398K) for 10 minutes as one thermal cycle. The number of cycles is 5, 15, 25 and 35. Thermal cycling induces changes in properties.

源语言英语
主期刊名18th International Conference on Electronic Packaging Technology, ICEPT 2017
编辑Chenxi Wang, Yanhong Tian, Tianchun Ye
出版商Institute of Electrical and Electronics Engineers Inc.
708-711
页数4
ISBN(电子版)9781538629727
DOI
出版状态已出版 - 19 9月 2017
活动18th International Conference on Electronic Packaging Technology, ICEPT 2017 - Harbin, 中国
期限: 16 8月 201719 8月 2017

出版系列

姓名18th International Conference on Electronic Packaging Technology, ICEPT 2017

会议

会议18th International Conference on Electronic Packaging Technology, ICEPT 2017
国家/地区中国
Harbin
时期16/08/1719/08/17

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