Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector

Yuan Dong Li; Guo Qiang Zeng; Liang Quan Ge; Cheng Jun Tan; Ya Dong Xu

Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector

Yuan Dong Li, Guo Qiang Zeng, Liang Quan Ge, Cheng Jun Tan, Ya Dong Xu

材料学院

Chengdu University of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

In order to study the characteristics of CdZnTe (CZT) semiconductor detector further, this article not only builds the test platform for the main characteristic parameters (the leakage current and the junction capacitance) and designs the test scheme, but also tests two detectors of different structures under different conditions and analyzes the test results. Through this experiment, we can better grasp the main features of the CZT detector, thus providing reference for its application in the field of radiation detection.

源语言	英语
页（从-至）	690-693
页数	4
期刊	Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology
卷	36
期	7
出版状态	已出版 - 20 7月 2016

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title = "Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector",

abstract = "In order to study the characteristics of CdZnTe (CZT) semiconductor detector further, this article not only builds the test platform for the main characteristic parameters (the leakage current and the junction capacitance) and designs the test scheme, but also tests two detectors of different structures under different conditions and analyzes the test results. Through this experiment, we can better grasp the main features of the CZT detector, thus providing reference for its application in the field of radiation detection.",

keywords = "Charge sensitive preamplifier, CZT semiconductor detector, The junction capacitance, The test of the leakage current",

author = "Li, {Yuan Dong} and Zeng, {Guo Qiang} and Ge, {Liang Quan} and Tan, {Cheng Jun} and Xu, {Ya Dong}",

year = "2016",

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T1 - Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector

AU - Li, Yuan Dong

AU - Zeng, Guo Qiang

AU - Ge, Liang Quan

AU - Tan, Cheng Jun

AU - Xu, Ya Dong

PY - 2016/7/20

Y1 - 2016/7/20

N2 - In order to study the characteristics of CdZnTe (CZT) semiconductor detector further, this article not only builds the test platform for the main characteristic parameters (the leakage current and the junction capacitance) and designs the test scheme, but also tests two detectors of different structures under different conditions and analyzes the test results. Through this experiment, we can better grasp the main features of the CZT detector, thus providing reference for its application in the field of radiation detection.

AB - In order to study the characteristics of CdZnTe (CZT) semiconductor detector further, this article not only builds the test platform for the main characteristic parameters (the leakage current and the junction capacitance) and designs the test scheme, but also tests two detectors of different structures under different conditions and analyzes the test results. Through this experiment, we can better grasp the main features of the CZT detector, thus providing reference for its application in the field of radiation detection.

KW - Charge sensitive preamplifier

KW - CZT semiconductor detector

KW - The junction capacitance

KW - The test of the leakage current

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AN - SCOPUS:85015345000

SN - 0258-0934

VL - 36

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JO - Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology

JF - Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology

IS - 7

ER -

Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector

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