@article{a8511510609543ee86e76dc7135ba2e4,
title = "Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy",
abstract = "To understand the effects of tellurium (Te) inclusions on the device performance of CdZnTe radiation detectors, the perturbation of the electrical field in and around Te inclusions was studied in CdZnTe single crystals via Kelvin probe force microscopy (KPFM). Te inclusions were proved to act as lower potential centers with respect to surrounding CdZnTe matrix. Based on the KPFM results, the energy band diagram at the Te/CdZnTe interface was established, and the bias-dependent effects of Te inclusion on carrier transportation is discussed.",
keywords = "Bias dependent, CdZnTe, Electrical property, Kelvin probe force microscopy, Te inclusion",
author = "Yaxu Gu and Wanqi Jie and Linglong Li and Yadong Xu and Yaodong Yang and Jie Ren and Gangqiang Zha and Tao Wang and Lingyan Xu and Yihui He and Shouzhi Xi",
note = "Publisher Copyright: {\textcopyright} 2016 Elsevier Ltd",
year = "2016",
month = sep,
day = "1",
doi = "10.1016/j.micron.2016.06.001",
language = "英语",
volume = "88",
pages = "48--53",
journal = "Micron",
issn = "0968-4328",
publisher = "Elsevier Ltd",
}