摘要
Amorphous diamond-like carbon (DLC) films were deposited on a silicon substrate by electrolysis of analytically pure dimethyl sulfoxide at relatively low voltage (150 V). Atomic force microscopy was used to investigate the surface morphology of the sample and indicated that the film was composed of small grains ∼ 100 nm in size. The composition and structure of the films were characterized by X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. Results showed that the deposits were hydrogenated DLC films containing considerable sp3 carbon, which could be transformed to sp2 carbon through an annealing treatment.
源语言 | 英语 |
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页(从-至) | D19-D21 |
期刊 | Electrochemical and Solid-State Letters |
卷 | 7 |
期 | 11 |
DOI | |
出版状态 | 已出版 - 2004 |
已对外发布 | 是 |