TY - JOUR
T1 - Structural, defect, and photoelectric characterization of CdTe-based single crystals grown by a vertical Bridgman method
AU - Wang, Boyang
AU - Yu, Pengfei
AU - Li, Yuting
AU - Xu, Qingyang
AU - Zhang, Yize
AU - Jie, Wanqi
N1 - Publisher Copyright:
© 2025 Elsevier Inc.
PY - 2025/5
Y1 - 2025/5
N2 - This study presents a comparative characterization of CdZnTe, CdMnTe, and CdMgTe single crystals, grown via a modified vertical Bridgman method, focusing on their structural, defect, optical, and electrical properties for room-temperature radiation detection applications. XRD analysis confirmed the sphalerite structure of all three crystals, with distinct preferred orientations influenced by spontaneous nucleation. CdMgTe crystal featured a lower density of Te inclusions (approximately 103 cm−2) compared to CdZnTe and CdMnTe. TEM analysis revealed all three crystals contained nanoscale Te precipitates, contributing to lattice distortion and dislocations. Compared to CdZnTe crystal, CdMnTe and CdMgTe exhibit better compositional uniformity. CdZnTe demonstrated superior crystal quality, with an average infrared transmittance of 62 % and a distinct free exciton peak in the photoluminescence spectrum. The resistivity of all three crystals met the specifications for room-temperature radiation detectors, with CdZnTe, exhibiting a resistivity of up to 7.09 × 1010 Ω·cm, showing the best detector performance.
AB - This study presents a comparative characterization of CdZnTe, CdMnTe, and CdMgTe single crystals, grown via a modified vertical Bridgman method, focusing on their structural, defect, optical, and electrical properties for room-temperature radiation detection applications. XRD analysis confirmed the sphalerite structure of all three crystals, with distinct preferred orientations influenced by spontaneous nucleation. CdMgTe crystal featured a lower density of Te inclusions (approximately 103 cm−2) compared to CdZnTe and CdMnTe. TEM analysis revealed all three crystals contained nanoscale Te precipitates, contributing to lattice distortion and dislocations. Compared to CdZnTe crystal, CdMnTe and CdMgTe exhibit better compositional uniformity. CdZnTe demonstrated superior crystal quality, with an average infrared transmittance of 62 % and a distinct free exciton peak in the photoluminescence spectrum. The resistivity of all three crystals met the specifications for room-temperature radiation detectors, with CdZnTe, exhibiting a resistivity of up to 7.09 × 1010 Ω·cm, showing the best detector performance.
KW - CdTe-based single crystals
KW - Radiation detector
KW - Resistivity
KW - Te precipitates
KW - Vertical Bridgman method
UR - http://www.scopus.com/inward/record.url?scp=85219122977&partnerID=8YFLogxK
U2 - 10.1016/j.matchar.2025.114899
DO - 10.1016/j.matchar.2025.114899
M3 - 文章
AN - SCOPUS:85219122977
SN - 1044-5803
VL - 223
JO - Materials Characterization
JF - Materials Characterization
M1 - 114899
ER -