TY - JOUR
T1 - Reliability analysis for accelerated life test based on Weibull distribution
AU - Li, Ling
AU - Xu, Wei
PY - 2010/7
Y1 - 2010/7
N2 - In order to make inference about problems of accelerated life test plan under different experiments, a step-stress accelerated life test model of units based on Weibull lifetimes is given. For this model, the maximum likelihood estimates of the parameters in normal stress level are derived under Type-II censoring. The Newton-Raphson method is using to solve the likelihood equations, and a simplified estimator is presented, which is used as an initial estimate in the iterative process. Bootstrap confidence intervals for the parameters are provided. Some numerical results for solid tantalum electrolytic capacitor are discussed to illustrate validity of this model.
AB - In order to make inference about problems of accelerated life test plan under different experiments, a step-stress accelerated life test model of units based on Weibull lifetimes is given. For this model, the maximum likelihood estimates of the parameters in normal stress level are derived under Type-II censoring. The Newton-Raphson method is using to solve the likelihood equations, and a simplified estimator is presented, which is used as an initial estimate in the iterative process. Bootstrap confidence intervals for the parameters are provided. Some numerical results for solid tantalum electrolytic capacitor are discussed to illustrate validity of this model.
KW - Accelerated life test
KW - Confidence intervals
KW - Likelihood estimates
KW - Weibull distribution
UR - http://www.scopus.com/inward/record.url?scp=77955831316&partnerID=8YFLogxK
U2 - 10.3969/j.issn.1001-506X.2010.07.045
DO - 10.3969/j.issn.1001-506X.2010.07.045
M3 - 文章
AN - SCOPUS:77955831316
SN - 1001-506X
VL - 32
SP - 1544
EP - 1548
JO - Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics
JF - Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics
IS - 7
ER -