Properties of the Au/p-CZT contact and effects of the CZT surface treatment states

Qiang Li; Wan Qi Jie; Li Fu; Xiao Qin Wang; Gang Qiang Zha; Ge Yang

Properties of the Au/p-CZT contact and effects of the CZT surface treatment states

Qiang Li, Wan Qi Jie, Li Fu, Xiao Qin Wang, Gang Qiang Zha, Ge Yang

材料学院

Northwestern Polytechnical University Xian

科研成果: 期刊稿件 › 文章 › 同行评审

1 引用（Scopus）

摘要

The I-V characteristics of Au/p-CZT contacts for various CZT surface treatment including etching and passivation were investigated in this paper. After the passivation, TeO₂ oxide layer with the thickness of 3.1nm was determined on the surface of CZT wafer through the analysis on the CZT surface elements by XPS. I-V characteristics of Au/p-CZT contacts with different surface treatment CZT wafer's surface were measured by Agilent 4339B high resistance meter. It was shown that etching and passivation could increase the barrier height of the Au/p-CZT and decrease the leakage current.

源语言	英语
页（从-至）	630-631+634
期刊	Gongneng Cailiao/Journal of Functional Materials
卷	37
期	4
出版状态	已出版 - 4月 2006

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title = "Properties of the Au/p-CZT contact and effects of the CZT surface treatment states",

abstract = "The I-V characteristics of Au/p-CZT contacts for various CZT surface treatment including etching and passivation were investigated in this paper. After the passivation, TeO2 oxide layer with the thickness of 3.1nm was determined on the surface of CZT wafer through the analysis on the CZT surface elements by XPS. I-V characteristics of Au/p-CZT contacts with different surface treatment CZT wafer's surface were measured by Agilent 4339B high resistance meter. It was shown that etching and passivation could increase the barrier height of the Au/p-CZT and decrease the leakage current.",

keywords = "I-V character, Passivation, Schottky contacts",

author = "Qiang Li and Jie, {Wan Qi} and Li Fu and Wang, {Xiao Qin} and Zha, {Gang Qiang} and Ge Yang",

year = "2006",

month = apr,

language = "英语",

volume = "37",

pages = "630--631+634",

journal = "Gongneng Cailiao/Journal of Functional Materials",

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T1 - Properties of the Au/p-CZT contact and effects of the CZT surface treatment states

AU - Li, Qiang

AU - Jie, Wan Qi

AU - Fu, Li

AU - Wang, Xiao Qin

AU - Zha, Gang Qiang

AU - Yang, Ge

PY - 2006/4

Y1 - 2006/4

N2 - The I-V characteristics of Au/p-CZT contacts for various CZT surface treatment including etching and passivation were investigated in this paper. After the passivation, TeO2 oxide layer with the thickness of 3.1nm was determined on the surface of CZT wafer through the analysis on the CZT surface elements by XPS. I-V characteristics of Au/p-CZT contacts with different surface treatment CZT wafer's surface were measured by Agilent 4339B high resistance meter. It was shown that etching and passivation could increase the barrier height of the Au/p-CZT and decrease the leakage current.

AB - The I-V characteristics of Au/p-CZT contacts for various CZT surface treatment including etching and passivation were investigated in this paper. After the passivation, TeO2 oxide layer with the thickness of 3.1nm was determined on the surface of CZT wafer through the analysis on the CZT surface elements by XPS. I-V characteristics of Au/p-CZT contacts with different surface treatment CZT wafer's surface were measured by Agilent 4339B high resistance meter. It was shown that etching and passivation could increase the barrier height of the Au/p-CZT and decrease the leakage current.

KW - I-V character

KW - Passivation

KW - Schottky contacts

UR - http://www.scopus.com/inward/record.url?scp=33745777224&partnerID=8YFLogxK

M3 - 文章

AN - SCOPUS:33745777224

SN - 1001-9731

VL - 37

SP - 630-631+634

JO - Gongneng Cailiao/Journal of Functional Materials

JF - Gongneng Cailiao/Journal of Functional Materials

IS - 4

ER -

Properties of the Au/p-CZT contact and effects of the CZT surface treatment states

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