TY - JOUR
T1 - Preparation and microwave permittivity of SiC-AlN solid solution powders
AU - Liu, Xiaokui
AU - Zhou, Wancheng
AU - Luo, Fa
AU - Zhu, Dongmei
PY - 2007
Y1 - 2007
N2 - SiC-AlN solid solution powders were prepared from the mixtures of aluminum, silicon and carbon black in a nitrogen atmosphere with preheating self-propagating high temperature synthesis (SHS) method. The powders synthesized with different ratios of Al/Si were mixed with paraffin wax and the microwave permittivity of the mixtures was measured at the frequency of 8.2-12.4GHz. The results were contrasted with that of SiC powders synthesized by preheating SHS in argon and nitrogen atmosphere respectively. The ε′, ε″, and the tgδ (ε″/ε′) of the mixture of SiC prepared in a nitrogen atmosphere are highest, followed with those of the SiC-AIN solid solution powders and the SiC powders prepared in an argon atmosphere. Along with the increase of atomic ratio of Al/Si, the ε′, ε″, and tgδ of SiC-AlN solid solution decrease. We believe that, with the increase of AlN dissolved, the concentration of carriers and the effect of dielectric relaxation will decrease because of the two contrary dopants.
AB - SiC-AlN solid solution powders were prepared from the mixtures of aluminum, silicon and carbon black in a nitrogen atmosphere with preheating self-propagating high temperature synthesis (SHS) method. The powders synthesized with different ratios of Al/Si were mixed with paraffin wax and the microwave permittivity of the mixtures was measured at the frequency of 8.2-12.4GHz. The results were contrasted with that of SiC powders synthesized by preheating SHS in argon and nitrogen atmosphere respectively. The ε′, ε″, and the tgδ (ε″/ε′) of the mixture of SiC prepared in a nitrogen atmosphere are highest, followed with those of the SiC-AIN solid solution powders and the SiC powders prepared in an argon atmosphere. Along with the increase of atomic ratio of Al/Si, the ε′, ε″, and tgδ of SiC-AlN solid solution decrease. We believe that, with the increase of AlN dissolved, the concentration of carriers and the effect of dielectric relaxation will decrease because of the two contrary dopants.
KW - Microwave permittivity
KW - Preheating SHS
KW - SiC-AlN solid solution
UR - http://www.scopus.com/inward/record.url?scp=33947212852&partnerID=8YFLogxK
U2 - 10.4028/0-87849-410-3.310
DO - 10.4028/0-87849-410-3.310
M3 - 文章
AN - SCOPUS:33947212852
SN - 1013-9826
VL - 336-338 I
SP - 310
EP - 312
JO - Key Engineering Materials
JF - Key Engineering Materials
ER -