On-line reliability assessment for an electronic system subject to condition monitoring

Shuai Zhao, Viliam Makis, Shaowei Chen, Yong Li

科研成果: 书/报告/会议事项章节会议稿件同行评审

10 引用 (Scopus)

摘要

We present a new approach for the on-line reliability assessment of an electronic system subject to condition monitoring. In this paper, the degradation of the electronic system is driven by a nonlinear Wiener process with a time drift, which is incorporated into the proportional hazards model to describe the hazard rate of the time to failure. Using the discretization of the degradation path and the time axis, closed-form approximations for the reliability quantities are obtained using the transition probability matrix. Unlike the conventional method which is applicable only for a small number of degradation states, the calculation of these quantities can be accomplished with just the basic manipulation of the transition matrix, which is computationally efficient and applicable to real-time conditional reliability calculation for a general number of states. The effectiveness of the proposed approach is demonstrated by a numerical study.

源语言英语
主期刊名2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781509003822
DOI
出版状态已出版 - 12 8月 2016
活动2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016 - Ottawa, 加拿大
期限: 20 6月 201622 6月 2016

出版系列

姓名2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016

会议

会议2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016
国家/地区加拿大
Ottawa
时期20/06/1622/06/16

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