摘要
Two PMP-processed YBCO specimens fabricated at different melting temperatures were investigated. The critical current density (Jc) was determined from flux-profile measurements. One sample was re-annealed at 880 degrees C for 30 hours to reduce the number of stacking faults and dislocations. The Jc values and irreversibility lines of this sample were measured before and after re-annealing. The results indicate that stacking faults and dislocations strongly influence the flux-pinning behaviour of PMP-processed YBCO superconductors.
源语言 | 英语 |
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文章编号 | 002 |
页(从-至) | 701-704 |
页数 | 4 |
期刊 | Superconductor Science and Technology |
卷 | 8 |
期 | 9 |
DOI | |
出版状态 | 已出版 - 1995 |
已对外发布 | 是 |