TY - JOUR
T1 - Feature enhancement and supervised contrastive learning for image splicing forgery detection
AU - Xu, Yanzhi
AU - Zheng, Jiangbin
AU - Fang, Aiqing
AU - Irfan, Muhammad
N1 - Publisher Copyright:
© 2023 Elsevier Inc.
PY - 2023/5
Y1 - 2023/5
N2 - Image forgery detection remains a challenging task due to the variation in the scale of the tampered areas and the forensic clues that are obscured by various post-processing operations. Most existing deep learning methods rely only on single-scale high-level features and ignore the correlations of the pixels in intra-image and inter-image. Due to this limitation, previous methods are considered unsuitable for multi-scale splicing forgery detection. To fill this gap, we propose a novel model for improving multi-scale splicing forged regions localization by utilizing multi-level multi-scale feature enhancement and pixel-level supervised contrastive learning. First, we introduce a multi-level multi-scale feature enhancement module (MFEM) to integrate the multi-level information and capture the multi-scale global contextual representation by embedding an improved atrous spatial pyramid pooling (ASPP) mechanism into the non-local module. It strengthens the capability of the model to sense multi-scale tampered regions. Second, the pixel-level supervised contrastive learning mechanism is designed to separately cluster the pixel representations of tampered and real regions within and across images. It improves intra-class compactness and inter-class separability of the pixel embedding space significantly and enhances feature expression capabilities. Third, we design a multi-loss progressive learning (MPL) strategy to integrate the complementary advantages of multi-loss functions to optimize the scale and position parameters of the tampered regions during the training process. Extensive experiments have shown that the proposed model outperforms state-of-the-art methods. It can effectively detect and segment multi-scale tampered regions, even for noisy and JPEG-compressed images.
AB - Image forgery detection remains a challenging task due to the variation in the scale of the tampered areas and the forensic clues that are obscured by various post-processing operations. Most existing deep learning methods rely only on single-scale high-level features and ignore the correlations of the pixels in intra-image and inter-image. Due to this limitation, previous methods are considered unsuitable for multi-scale splicing forgery detection. To fill this gap, we propose a novel model for improving multi-scale splicing forged regions localization by utilizing multi-level multi-scale feature enhancement and pixel-level supervised contrastive learning. First, we introduce a multi-level multi-scale feature enhancement module (MFEM) to integrate the multi-level information and capture the multi-scale global contextual representation by embedding an improved atrous spatial pyramid pooling (ASPP) mechanism into the non-local module. It strengthens the capability of the model to sense multi-scale tampered regions. Second, the pixel-level supervised contrastive learning mechanism is designed to separately cluster the pixel representations of tampered and real regions within and across images. It improves intra-class compactness and inter-class separability of the pixel embedding space significantly and enhances feature expression capabilities. Third, we design a multi-loss progressive learning (MPL) strategy to integrate the complementary advantages of multi-loss functions to optimize the scale and position parameters of the tampered regions during the training process. Extensive experiments have shown that the proposed model outperforms state-of-the-art methods. It can effectively detect and segment multi-scale tampered regions, even for noisy and JPEG-compressed images.
KW - Feature enhancement
KW - Global contextual representations
KW - Image forgery
KW - Supervised contrastive learning
UR - http://www.scopus.com/inward/record.url?scp=85150484935&partnerID=8YFLogxK
U2 - 10.1016/j.dsp.2023.104005
DO - 10.1016/j.dsp.2023.104005
M3 - 文章
AN - SCOPUS:85150484935
SN - 1051-2004
VL - 136
JO - Digital Signal Processing: A Review Journal
JF - Digital Signal Processing: A Review Journal
M1 - 104005
ER -