Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

Jian Guo Zheng; Qi Li; Duan Feng; Shi Yin Ding; Shi Dong Yu; Guang Jun Shen; Feng Sheng Liu; Lian Zhou; Hui Lin Mou

doi:10.1063/1.352117

Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

Jian Guo Zheng, Qi Li, Duan Feng, Shi Yin Ding, Shi Dong Yu, Guang Jun Shen, Feng Sheng Liu, Lian Zhou, Hui Lin Mou

科研成果: 期刊稿件 › 文章 › 同行评审

3 引用（Scopus）

摘要

Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

源语言	英语
页（从-至）	4634-4637
页数	4
期刊	Journal of Applied Physics
卷	72
期	10
DOI	https://doi.org/10.1063/1.352117
出版状态	已出版 - 1992
已对外发布	是

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@article{414dd7dffc9549289aba0d6dff501062,

title = "Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors",

abstract = "Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.",

author = "Zheng, {Jian Guo} and Qi Li and Duan Feng and Ding, {Shi Yin} and Yu, {Shi Dong} and Shen, {Guang Jun} and Liu, {Feng Sheng} and Lian Zhou and Mou, {Hui Lin}",

year = "1992",

doi = "10.1063/1.352117",

language = "英语",

volume = "72",

pages = "4634--4637",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "10",

}

TY - JOUR

T1 - Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

AU - Zheng, Jian Guo

AU - Li, Qi

AU - Feng, Duan

AU - Ding, Shi Yin

AU - Yu, Shi Dong

AU - Shen, Guang Jun

AU - Liu, Feng Sheng

AU - Zhou, Lian

AU - Mou, Hui Lin

PY - 1992

Y1 - 1992

N2 - Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

AB - Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

UR - http://www.scopus.com/inward/record.url?scp=26844531397&partnerID=8YFLogxK

U2 - 10.1063/1.352117

DO - 10.1063/1.352117

M3 - 文章

AN - SCOPUS:26844531397

SN - 0021-8979

VL - 72

SP - 4634

EP - 4637

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

ER -

Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

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