摘要
Efficient doping of organic semiconductors is an important prerequisite for the fabrication of high performance organic electronic devices. In this work, we describe a novel single precursor low-temperature (70 °C) vapor phase infiltration (VPI) process to dope poly(3-hexyl)thiophene (P3HT). The infiltration is performed with the metal containing atomic layer deposition (ALD) precursor MoCl5. The conductivities of the polymer are assessed with four-point probe measurements and showed significant enhancement by up to 5 orders of magnitude, confirming the efficiency of the VPI process. The chemical changes resulting from the infiltration of P3HT are characterized by applying UV-Vis-NIR, Raman spectroscopy, and FTIR. The crystalline state of the material is analyzed by X-ray diffraction (XRD). SEM micrographs and AFM images show that the morphologies of the samples before and after the MoCl5 infiltration process do not seriously change. TEM images of cross-sections of the thin film clearly show that the vapor phase infiltration process results in the incorporation of Mo into the bulk of the polymer.
源语言 | 英语 |
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页(从-至) | 2686-2694 |
页数 | 9 |
期刊 | Journal of Materials Chemistry C |
卷 | 5 |
期 | 10 |
DOI | |
出版状态 | 已出版 - 2017 |
已对外发布 | 是 |