Effects of post-growth annealing on the performance of CdZnTe: In radiation detectors with different thickness

Pengfei Yu, Wanqi Jie

科研成果: 期刊稿件文章同行评审

10 引用 (Scopus)

摘要

An effective post-growth annealing method was used to improve the performance of CdZnTe:In (CZT:In) radiation detectors. The results indicated that Te inclusions in CZT:In crystals with different thickness were eliminated completely after annealing. Both the resistivity and IR transmittance of annealed CZT:In crystals with different thickness increased obviously, which suggested that the crystal quality was improved. For the detector fabricated by annealed CZT:In slices with 2 mm thickness, the energy resolution and (μτ)e value were enhanced about 63% and 115%, respectively. And for that fabricated by annealed CZT:In slices with 5 mm thickness, the energy resolution and (μτ)e value were enhanced about 300% and 88%, respectively.

源语言英语
页(从-至)29-32
页数4
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
737
DOI
出版状态已出版 - 11 2月 2014
已对外发布

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