Effects of bias voltage on structure and properties of TiAl-doped a-C:H films prepared by magnetron sputtering

Xianjuan Pang, Junying Hao, Peng Wang, Yanqiu Xia, Weimin Liu

科研成果: 期刊稿件文章同行评审

15 引用 (Scopus)

摘要

Hydrogenated TiAl-doped a-C:H films were deposited on Si substrates by middle frequency magnetron sputtering TiAl target in argon and methane gas mixture atmosphere. Effects of substrate bias voltage on structure and properties of the films, such as the surface morphology, hardness, chemical nature and bond types, were investigated by means of atomic force microscopy (AFM), XPS, Raman spectroscopy and nanoindentation. The friction and wear behaviors of the deposited films were characterized on an UMT-2MT tribometer. SEM was utilized to analyze the wear scar on steel balls and debris after sliding on the deposited films under dry friction conditions. The results demonstrated that the film deposited at - 100 V exhibited low friction coefficient which is attributed to the easier formation of graphitized transfer layer.

源语言英语
页(从-至)677-682
页数6
期刊Surface and Interface Analysis
43
3
DOI
出版状态已出版 - 3月 2011
已对外发布

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