Effect of electric current on constitutive behaviour and microstructure of SAC305 solder joint

Wenbin Tang, Xu Long, Yongchao Liu, Chongyang Du, Yao Yao, Cheng Zhou, Yanpei Wu, Fengrui Jia

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

As the traditional lead-containing solders were banned for consumer electronics by RoHS laws, lead-free solders are widely adopted in the electronics packaging industry. The Sn-3.0Ag-0.5Cu (wt%, SAC305) solder material is one of the most commonly used die-attach solders. But the reliability of SAC305 solder joints under complex working conditions still requires to be carefully investigated. In this paper, the uniaxial tensile behavior of solder joint specimens with a diameter of 1.0 mm was investigated subjected to the strain rate of 10-4 s-1 under electric current density ranging from 1000 A/cm2 to 4000 A/cm2. In order to reveal the current stress effect under the mechanical-electrical coupled loadings, the uniaxial tensile properties of SAC305 solder joint specimens were measured by a multi-field loading system. In addition, the microstructure of the tensile specimens is observed by a scanning electron microscope. It was found that fracture mode changed from ductile fracture to the combination of brittle and ductile fracture when the current density raised from 1000A/cm2 to 2000A/cm2. And the fracture was more likely to happen near the interface when the current density is higher.

源语言英语
主期刊名2018 IEEE 20th Electronics Packaging Technology Conference, EPTC 2018
出版商Institute of Electrical and Electronics Engineers Inc.
717-721
页数5
ISBN(电子版)9781538676684
DOI
出版状态已出版 - 12月 2018
活动20th IEEE Electronics Packaging Technology Conference, EPTC 2018 - Singapore, 新加坡
期限: 4 12月 20187 12月 2018

出版系列

姓名2018 IEEE 20th Electronics Packaging Technology Conference, EPTC 2018

会议

会议20th IEEE Electronics Packaging Technology Conference, EPTC 2018
国家/地区新加坡
Singapore
时期4/12/187/12/18

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