Effect of cohesive behaviour and residual stress on the indentation response of elastoplastic film/substrate structure

Jiao Li, Xu Long

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In this study, the effects of cohesive behaviour and residual stress on the indentation response of an elastoplastic film/substrate structure were explored. A finite element model was developed by highlighting the contact between the Berkovich rigid indenter and the film/substrate model. The behaviour of the film is defined as the power-law constitutive properties, the substrate is assumed to be perfectly elastic, and the cohesive zone model is employed to evaluate the film/substrate interface interaction. By emphasizing the cohesive behaviour, delamination between the film and the substrate is investigated as an influential factor in the damage of layered device. In addition, the residual stresses generated during the thin film preparation are considered in the finite element model. Predictions of parameters such as Young's modulus, yield strength and hardening exponent were made based upon the curves derived from the finite element analysis. A dimensionless function is derived from the finite element simulation and an algorithm is proposed to reversely solve the intrinsic parameters and residual stresses of the elastoplastic material from the indentation response.

源语言英语
主期刊名Proceedings of the 25th Electronics Packaging Technology Conference, EPTC 2023
编辑Andrew Tay, King Jien Chui, Yeow Kheng Lim, Chuan Seng Tan, Sunmi Shin
出版商Institute of Electrical and Electronics Engineers Inc.
829-833
页数5
ISBN(电子版)9798350329575
DOI
出版状态已出版 - 2023
活动25th Electronics Packaging Technology Conference, EPTC 2023 - Singapore, 新加坡
期限: 5 12月 20238 12月 2023

出版系列

姓名Proceedings of the 25th Electronics Packaging Technology Conference, EPTC 2023

会议

会议25th Electronics Packaging Technology Conference, EPTC 2023
国家/地区新加坡
Singapore
时期5/12/238/12/23

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