TY - JOUR
T1 - Dynamic recrystallization mechanism and twinning behavior in hot deformation of Ti-46.5Al-2Nb-2Cr with initial duplex microstructure
AU - Chen, Yuanyu
AU - Li, Lian
AU - Li, Hong
AU - Li, Miaoquan
N1 - Publisher Copyright:
© 2023 Elsevier Inc.
PY - 2023/3
Y1 - 2023/3
N2 - The dynamic recrystallization (DRX) mechanism and twinning behavior of Ti-46.5Al-2Nb-2Cr in the α + γ two-phase region were investigated in this work. Isothermal compression of Ti-46.5Al-2Nb-2Cr with initial duplex microstructure was performed at the deformation temperatures of 1180–1260 °C, the height reductions of 20–60% and strain rates of 0.001–1.0 s−1. Quantitative characterization of grain boundary misorientation, local misorientation and geometrically necessary dislocation (GND) density in the γ phase was made to investigate the DRX behavior. The results showed that DRX occurred in the γ grains and the γ lamellae of the α2/γ lamellar colonies as the height reduction increased, and the interaction between the deformation temperature and the strain rate influenced the volume fraction of the recrystallized γ phase. Discontinuous DRX (DDRX) via nucleation and grain growth dominated the DRX in the γ phase at a strain rate of 0.001 s−1, in which the volume fraction of the recrystallized γ phase increased with the increasing of deformation temperature. Continuous DRX (CDRX) via transition from medium-angle grain boundaries (MABs) to high-angle grain boundaries (HABs) dominated the DRX in the γ phase at a strain rate of 1 s−1, in which the volume fraction of the recrystallized γ phase decreased with the increasing of deformation temperature. γ/γ twin boundaries were quantitatively investigated. It was shown that γ true twin (TT) was the main twin component formed in the recrystallized γ grains. The fraction of the γ/γ twin boundaries increased with the increasing of deformation temperature at a strain rate of 0.001 s−1 and height reduction of 60%, which decreased with the increasing of strain rate at a deformation temperature of 1260 °C and height reduction of 60%. Transmission electron microscopy and high-resolution TEM (HRTEM) characterizations of the dislocations and stacking fault (SSF) in the γ phase showed that the growth of the DDRX γ grains promoted the occurrence of γ twin.
AB - The dynamic recrystallization (DRX) mechanism and twinning behavior of Ti-46.5Al-2Nb-2Cr in the α + γ two-phase region were investigated in this work. Isothermal compression of Ti-46.5Al-2Nb-2Cr with initial duplex microstructure was performed at the deformation temperatures of 1180–1260 °C, the height reductions of 20–60% and strain rates of 0.001–1.0 s−1. Quantitative characterization of grain boundary misorientation, local misorientation and geometrically necessary dislocation (GND) density in the γ phase was made to investigate the DRX behavior. The results showed that DRX occurred in the γ grains and the γ lamellae of the α2/γ lamellar colonies as the height reduction increased, and the interaction between the deformation temperature and the strain rate influenced the volume fraction of the recrystallized γ phase. Discontinuous DRX (DDRX) via nucleation and grain growth dominated the DRX in the γ phase at a strain rate of 0.001 s−1, in which the volume fraction of the recrystallized γ phase increased with the increasing of deformation temperature. Continuous DRX (CDRX) via transition from medium-angle grain boundaries (MABs) to high-angle grain boundaries (HABs) dominated the DRX in the γ phase at a strain rate of 1 s−1, in which the volume fraction of the recrystallized γ phase decreased with the increasing of deformation temperature. γ/γ twin boundaries were quantitatively investigated. It was shown that γ true twin (TT) was the main twin component formed in the recrystallized γ grains. The fraction of the γ/γ twin boundaries increased with the increasing of deformation temperature at a strain rate of 0.001 s−1 and height reduction of 60%, which decreased with the increasing of strain rate at a deformation temperature of 1260 °C and height reduction of 60%. Transmission electron microscopy and high-resolution TEM (HRTEM) characterizations of the dislocations and stacking fault (SSF) in the γ phase showed that the growth of the DDRX γ grains promoted the occurrence of γ twin.
KW - Continuous dynamic recrystallization
KW - Discontinuous dynamic recrystallization
KW - Quantitative characterization
KW - Ti-46.5Al-2Nb-2Cr
KW - γ twin
UR - http://www.scopus.com/inward/record.url?scp=85146553295&partnerID=8YFLogxK
U2 - 10.1016/j.matchar.2023.112678
DO - 10.1016/j.matchar.2023.112678
M3 - 文章
AN - SCOPUS:85146553295
SN - 1044-5803
VL - 197
JO - Materials Characterization
JF - Materials Characterization
M1 - 112678
ER -