Dual-wavelength technology used in anti-interference for long-range and short-distance detection

Haojun Zhang, Jianlin Zhao, Ju Ren, Limin Sun

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Technology of interference becomes more advancing. Adopting fog and aerosols is the best way to interfere optical detection. Due to the fog and aerosols, target recognition becomes difficult under this environment. In the present paper a method is given to solve this problem in a simple way. A dual-wavelength technology used in anti-interfere for long range and short distance detection is introduced in this paper, which can discriminate the backscattering reflection of fog and aerosols. In the present work the scattering character of the special fog and aerosols environment is calculated using the Rayleigh scattering method and Mie scattering method. The scattering characters in different environment are analyses using two wavelengths, i.e. one wavelength lies in ultraviolet wave band, the other in near infrared wave band. The results indicated that the ratio of proportion-discrimination is usually greater than 2, and deeper the strength of the fog and aerosols, the greater the ratio. This method also validated by experiment. In the present study, three kinds of wavelength such as 405nm, 670nm and 808nm are adopted. The intensity data collected shows that the ratio is greater than 3. The performance and working principle of the system and its components are analyzed in details. Based on the full system, the dual-wavelength technology can be well applied. The result of the experiments also proves that the technology is efficient, especially in the heavy fog and aerosols environment. The dual wavelength method can be used for long range and short distance detection.

源语言英语
主期刊名MIPPR 2009 - Remote Sensing and GIS Data Processing and Other Applications
DOI
出版状态已出版 - 2009
活动MIPPR 2009 - Remote Sensing and GIS Data Processing and Other Applications: 6th International Symposium on Multispectral Image Processing and Pattern Recognition - Yichang, 中国
期限: 30 10月 20091 11月 2009

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
7498
ISSN(印刷版)0277-786X

会议

会议MIPPR 2009 - Remote Sensing and GIS Data Processing and Other Applications: 6th International Symposium on Multispectral Image Processing and Pattern Recognition
国家/地区中国
Yichang
时期30/10/091/11/09

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