Dislocation reaction mechanism of microcrack formation in (Cd, Mn) Te crystal

Lijun Luan, Li Gao, Hongwei Liu, Zong wen Liu, Pengfei Yu, Tao Wang, Li Duan, Peng Jin

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摘要

The formation of a faulted dipole shaped like a letter Z (Z-shape) and a microcrack shaped like a letter S (S-shape) was investigated in (Cd, Mn) Te single crystal by transmission electron microscopy. Dislocations around the microcrack were determined as perfect dislocations and Shockley partial dislocations (partials) by different two-beam conditions. The nipped stair rod dislocation was produced by the interaction of two partials lying on mutually inclined {1 1 1} planes. The faulted dipole was generated by two partials moving toward the opposite directions on parallel {1 1 1} planes. Owing to the locking effect of Z-shape faulted dipole, the S-shape microcrack occurred along [1 1 1¯] direction.

源语言英语
文章编号125791
期刊Journal of Crystal Growth
547
DOI
出版状态已出版 - 1 10月 2020

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