Dislocation reaction mechanism of microcrack formation in (Cd, Mn) Te crystal

The formation of a faulted dipole shaped like a letter Z (Z-shape) and a microcrack shaped like a letter S (S-shape) was investigated in (Cd, Mn) Te single crystal by transmission electron microscopy. Dislocations around the microcrack were determined as perfect dislocations and Shockley partial dislocations (partials) by different two-beam conditions. The nipped stair rod dislocation was produced by the interaction of two partials lying on mutually inclined {1 1 1} planes. The faulted dipole was generated by two partials moving toward the opposite directions on parallel {1 1 1} planes. Owing to the locking effect of Z-shape faulted dipole, the S-shape microcrack occurred along [1 1 1¯] direction.